Keithley Offers Industry's First Complete Pulsed Power Measurement Solution for Testing Laser Diodes

Cleveland,Ohio -- August 20, 2002 - Keithley Instruments, Inc. (NYSE:KEI) today introduced the Model 2520INT Integrating Sphere Photodetector. Together, the Model 2520INT and Keithley's Model 2520 Pulsed Laser Diode Test System are the industry's only complete pulsed source and measure solution for high accuracy measurements of laser diode optical power at the wafer, bar, or chip level. They can be used for production testing of 980nm and 1480nm EDFA pump lasers, Raman amplifiers, telecommunication laser diodes, and high power telecommunication vertical cavity surface emitting lasers (VCSELs). The 2520's 1-inch sphere with Germanium Detector provides a wide wavelength operating range, ease of setup, and superior low-level power measurement. A highly reflective Spectralon™ interior surface scatters and diffuses the light output from the DUT uniformly over the interior of the sphere, with minimal absorption loss. This diffusion automatically attenuates the power level, permitting the testing of higher power devices without detector damage. High-speed response handles pulse widths as short as 500ns, and wavelengths of 700-1700nm. Power capacity is up to 7W, depending on wavelength. An SMA fiber tap shortens test time by allowing measured light to be sent to another instrument for additional measurements. Calibration constants are provided for easy programming of test systems.