FOR IMMEDIATE RELEASE
Contact: Keithley Instruments, Inc.
Keithley's Yuegang Zhao Chosen to Present Paper at International Solid-State and Integrated-Circuit Technologies Conference
Cleveland, Ohio - October 15, 2004 - Keithley Instruments, Inc. (NYSE:KEI), a leader in solutions for emerging measurement needs, today announced that Yuegang Zhao will orally present his paper "Effective Minimization of Charge Trapping in High-k Gate Dielectrics with an Ultra-short Pulse Technique" at the 7th International Conference on Solid-State and Integrated-Circuit Technology (ICSICT). The 2004 ICSICT Program and Organizing committees selected Zhao for this distinction. The Conference will be held October 18 - 21, 2004, in Beijing, China.
The findings in the paper were developed in conjunction with SEMATECH, the global consortium of semiconductor manufacturers, as a part of an electrical characterization methodology development project.
Zhao is a senior applications engineer with Keithley's Semiconductor Business Group. He holds a M.S. in Semiconductor Physics from the University of Wisconsin and a B.S. in Physics from Beijing University in Beijing, China.
About Keithley Instruments. With more than 50 years of measurement expertise, Keithley Instruments has become a world leader in advanced electrical test instruments and systems from DC to RF (radio frequency) geared to the specialized needs of electronics manufacturers for high performance production testing, process monitoring, product development, and research. By building upon our strength in electrical measurement solutions for research, Keithley has become a production test technology leader for the semiconductor, wireless, optoelectronics, and other precision electronics segments of the worldwide electronics industry. The value we provide to our customers is a combination of precision measurement technology and a rich understanding of their applications to improve the quality, throughput, and yield of their products.
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