----------------------------------------------------------- Customer Release Notes for TekExpress DDR Tx Product: TekExpress DDR Tx [DDR5SYS, LPDDR5SYS] Version: 10.3.6 Platform: Win10 Last Revised: Jan-2021 ----------------------------------------------------------- Contents of this Readme file: 1. TekExpress DDR Tx Overview 2. What is New in this Release 3. System Requirements 4. Known Limitations 5. Known Issues 6. Contacting Tektronix ----------------------------------------------------------- 1. TekExpress DDR Tx Analysis Overview The Tektronix TekExpress DDR Tx is an automated test application to validate and debug DDR5 and LPDDR5 design of the respective DUTs as per the latest JEDEC specifications. ----------------------------------------------------------- 2. What is New in this release v10.3.6: Includes ****************** 1. LPDDR5: a. Updated CA-CS-PW measurements. b. Updated Reference level for VIX-WCK-Ratio measurement. v10.3.5: Includes ****************** Key features for LPDDR5: 1. Supports 52 measurements of LPDDR5 System Transmitter Tests as per LPDDR5 JEDEC specifications: a. 09 Clock measurements b. 11 Write Clock measurements c. 11 Write Data measurements d. 07 Read Data measurements e. 07 CA Rx Specification measurements f. 07 CS Rx Specification measurements 2. Number of UIs support for Clock, Write Clock, Write Data and Read Data measurements. 3. Hexagonal shape mask and margin analysis. Key features for DDR5: 1. Performance improvement in overall test execution time when all tests are selected. 2. Single Acquire Type for CLOCK, DATA [Write], DATA [READ], CA measurements; group wise and Analyze. 3. Automatic calculation of amplitude for Read Write Burst detection. 4. Total 52 Measurements of DDR5 System Transmitter Tests as per DDR5 JEDEC Specification a. 21 Clock Measurements b. 9 Write Burst Measurements c. 1 Write Data Eye Measurement d. 13 Read Burst Measurements e. 8 Command and Address Measurements 5. Number of UIs support for Clock and Read/Write Data measurements. 6. Diamond shape mask and margin analysis for Write Data Eye measurement 7. DDR DFE: Deploys 'DDR DFE' Standalone application, that can be launched from TekScope > Analyze > DDR DFE 8. DDR DFE: Support DFE for Write Data Eye measurements 9. DDR DFE: Added Threshold "Auto" option selection. 10. DDR DFE: Increased the record length capability for continuous signal. Key features applicable for both DDR5 and LPDDR5: 1. De-embedding support applicable as per respective signal type in both Devices. 2. User Defined Acquisition support for all signal types respectively in both Devices. 3. Multi-Run feature is applicable for all tests in both Devices. 4. All tests are De-selected by default in Test Selection tab. 5. All acquisition sources are De-selected by default in Acquisition panel. 6. Enabled de-embedding and TriMode probe support in User Defined Acquisition (UDA). 7. Acquire parameters like Record Length and Sample Rate are moved to Global Configurations. 8. Save worst case waveform in known / TekExpress sessions. 9. Retain Vertical Scale support during acquisition. 10. Visual trigger setup file support in Visual Search. 11. User friendly measurement configurations. 12. Test Report to reflect all the statistics of the measurement. 13. User can select the source and channel in acquisition panel. 14. Voltage settings moved into common location for easy access. 15. Multiple Burst Detection Method supported - Read and Write, Write Only, Read Only, Visual Search. v10.2.1: Includes ****************** 1. Total 52 Measurements of DDR5 System Transmitter Tests as per DDR5 JEDEC Specification a. 21 Clock Measurements b. 9 Write Burst Measurements c. 1 Write Data Eye Measurement d. 13 Read Burst Measurements e. 8 Command and Address Measurements 2. User defined acquisition mode for Clock, Command Address, Data Strobe, and Data for both Write and Read traffic (or bursts) 3. De-embedding support for Clock, Command Address, Data Strobe, and Data for both Write and Read traffic (or bursts) 4. Number of UIs support for Clock and Read/Write Data measurements 5. Deploys 'DDR DFE' Standalone application, that can be launched from TekScope > Analyze > DDR DFE 6. Support DFE for Write Data Eye measurements 7. User friendly measurement configurations 8. Test Report to reflect all the statistics of the measurement 9. User can select the source and channel in acquisition panel 10. Multiple Burst Detection Method supported - Read and Write, Write Only, Read Only, Visual Search 11. Diamond shape mask and margin analysis for Write Data Eye measurement ------------------------------------------------------------ 3. System Requirements To use TekExpress DDR Tx measurements following are the required software: - LPDDR5SYS: LPDDR5 Memory Bus Electrical Validation and Analysis Oscilloscope Software. - DDR5SYS: DDR5 Memory Bus Electrical Validation and Analysis Oscilloscope Software. - SDLA64: Serial Data Link Analysis for Win 64-bit Scopes. - DJA: DPOJET Jitter Analysis. - VET: VET – Visual Trigger. Supported Oscilloscopes: DPO71604SX, DPO72304SX, DPO73304SX. Non-ATI channels of DPS75004SX, DPS75904SX, DPS77004SX. MSO72304DX, MSO72504DX, MSO73304DX, DPO72304DX, DPO72504DX, DPO73304DX. with... TekScope version >= v10.12.x. DPOJET version >= 10.3.0. ----------------------------------------------------------- 4. Known Limitations - Scope voltage noise floor is not considered. - Rj values might be higher if the signal has random tone jitter. - In few cases, the algorithm reports the lower Dj value. - Maximum Record Length up to 10M is recommended for running the measurements optimally. ----------------------------------------------------------- 5. Known Issues - None as of now. ----------------------------------------------------------- 6. Contacting Tektronix Tektronix, Inc. 14150 SW Karl Braun Drive P.O. Box 500 Beaverton, OR 97077 USA For product information, sales, service, and technical support: In North America, call 1-800-833-9200. Worldwide, visit www.tektronix.com to find contacts in your area.