----------------------------------------------------------- Customer Release Notes for TekExpress DDR Tx Product: TekExpress DDR Tx [DDR5SYS, LPDDR5SYS] Version: 20.1.2 Platform: Win10 Last Revised: Aug - 2026 ----------------------------------------------------------- Contents of this Readme file: 1. TekExpress DDR Tx Overview 2. What is New in this Release 3. System Requirements 4. Known Limitations 5. Known Issues 6. Contacting Tektronix ----------------------------------------------------------- 1. TekExpress DDR Tx Analysis Overview The Tektronix TekExpress DDR Tx is an automated test application to validate and debug DDR5 and LPDDR5-5X design of the respective DUTs as per the latest JEDEC specifications. ----------------------------------------------------------- 2. What is New in this release v20.1.2: Includes. ****************** Key features for LPDDR5: 1. Support to Read Eye Height and Read Eye Width measurements. 2. Support to "Long Burst mode" of Clock signal for all Clock Differential measurements. 3. Support for user-defined clock offset option for LPDDR5 CA Measurements. Key features applicable for both DDR5 and LPDDR5: 1.Support for probe tips P77STFLXA,P77STFLXB,P77STCABL,P77STLRCB,P77BRWSR v20.1.0: Includes. ****************** Key features for DDR5: 1. Added probe tip P77C292MM support. 2. SCPI command for CA source of address command updated from TEKEXP:VALUE GENERAL,"ADDR CMD Probe Mode" to TEKEXP:VALUE GENERAL,"CA Probe Mode" Key features applicable for both DDR5 and LPDDR5: 1. Updated Vcent algorithm for measurements which use explicit clock source. v20.0.0: Includes. ****************** Key features for LPDDR5-5X: 1. Support to EIGHTEEN new measurements for LPDDR5-5X continuous Write Clock Test. 2. Support to Overshoot-Undershoot DQ measurements in "Continuous mode of WCK" for 'Write Clock' tests. 3. Support to all measurements in "Long Burst mode of WCK" for 'Write Clock' tests. 4. Support to Eye Height and Width measurements for LPDDR5-5X Write Data test. 5. Support to all measurements in "Continuous mode of WCK" as well as "Long Burst mode of WCK" for 'Write Burst' tests for both 'Write Only Burst' and 'Read & Write Burst' mode. 6. Option to specify a 'Don't Care Length' in the Write Burst feature for both 'Write Only Burst' and 'Read Write Burst'. 7. Support for Zoom Plot with cursors for Clock and Write Clock Test. 8. CA/CS - Mask test is updated as per JEDEC specification JESD209-5C. 9. VIX_CK_Ratio and VIX_WCK_Ratio test is updated as per JEDEC specification JESD209-5C. 10. Limits for all data-rates and measurements are updated in-line with latest specification JESD209-5C. 11. Noise compensation algorithm updated for tCK TJ measurement. Key features for DDR5: 1. Support to tDQSQ measurement for DDR5 Read Data test. 2. Support to 2N mode for CA test. 3. Number of UIs support for CA and CS measurements. 4. Support for Zoom Plot with cursors for Clock Test. 5. Limits for all data-rates and measurements are updated in-line with latest specification JESD79-5C.01_v1.31. 6. Support for 8800MT/s data rate in-line with latest specification JESD79-5C.01_v1.31. 7. Algorithm enhancement for Read Write postamble and preamble measurements in-line with latest specification JESD79-5C.01_v1.31. Key features applicable for both DDR5 and LPDDR5: 1. Support to new oscilloscope: 7 Series DPO. 2. Updated burst separation algorithms. 3. Migrated to new TekExpress Framework v5.12.x v10.5.2: Includes. ****************** Key features for LPDDR5-5X: 1. Support for LPDDR5X data rates. 2. Support for tDQ2DQ measurement. 3. Support for tCA2CA measurement. 4. Support to NINE new measurements for LPDDR5X data rates. 5. Limits for all data-rates are updated in-line with latest specification JESD209-5B. 6. Limits update for tQH and tWCK2DQI measurements for specification 5B. 7. Vinse reference level to be taken from Vcent/ref-CA instead of VDDQ/2. Key features for DDR5: 1. Support to SEVEN new measurements. 2. CA - Mask test is updated as per JEDEC specification and uses the rising edge of the clock. 3. CA - TcIPW test is updated as per JEDEC specification. 4. Provision to give 'Noise Compensation' option in 'Clock > Configure > Measurements > Analyze', applicable for Clock RJ measurements. 5. Provision to set SSC 'On/Off' as per DUT configuration for Clock jitter measurements, by default SSC will be set to 'Off'. 6. Support for DDR5 data rates in DFE plugin. Key features applicable for both DDR5 and LPDDR5: 1. Support to the new oscilloscope models: DPO71604DX, DPO72004DX, MSO71604DX, MSO72004DX, DPO72004SX, and DPO72504SX 2. Custom data rate support till 15000MT/s. 3. Bandwidth support till 70GHz. 4. Test report reflects supported JEDEC specification version. 5. Updated burst separation algorithms. Note: ----- 1. Once 'Scope Noise Characterization' is measured using the plug-in, enter the value in TekExpress solution for 'Manual' option, that will be used for applicable measurements; else enter the 'Reference ID' for TekExpress solution to pick the 'Noise Compensation' 'Automatically'. 2. [DDR5] CA limits are applied as per 'Option 3' from Table 203/204 of the specification. v10.4.4: Includes. ****************** Key features for LPDDR5: 1. Added configure option to round up the tck(Avg) and twck(Avg) measurements. 2. Limit update for Clock tck(abs) measurement at the Data Rate of 5500MT/s with 'WCK:CK Ratio' as 4:1. 3. Along with previous 52 measurements, added new 72 measurements of LPDDR5 System Transmitter Tests as per LPDDR5 JEDEC specifications: 4. Single-ended mode support added for Clock, WCK and RDQS measurements. 5. Improved Burst Separation algorithms. Key features for DDR5: 1. Performance improvement in overall test execution time when all tests are selected. 2. Change in default Reference Levels settings-based signal probe configuration for DDR5, in-line with LPDDR5. 3. Change in Measurement Configuration, one set of configurations for all measurements in a group, in-line with LPDDR5. 4. Test Results and Test Report format updated and in-line with LPDDR5. 5. Scope Noise Characterization support to DDR5 Clock Random Jitter Measurements. 6. Scope Noise Characterization value is measured using the Scope Noise Characterization tool available with DPOJET Version >=10.4.0. Features applicable for both DDR5 and LPDDR5: 1. Integrated with new TekExpress Framework v5.5.0.97, which adds improved GUI for 'Results Panel - shows statistics in detail', 'Report Panel', 'pre-recorded mode' and 'multiple configurations / sessions' in same Test Setup. 2. Support to Single Unit Non-ATI channels of DPO75002SX, DPO75902SX, DPO77002SX. 3. Limits will be updated per measurements as per Data Rate selected. 4. Limits for Custom Data Rate will be updated to closest data rate of the measurements. 5. Save-Recall-Limits features added. 6. Show only results option added for Test Report. 7. Test Report will show the 'Signal' type for the executed measurements on respective 'Source'. Note: ----- 'Scope Noise Characterization' is supported manually in this release. 'Scope Noise Characterization' / 'Noise Compensation' requires oscilloscope option 'DJAN'. User Manual is not updated for this version. v10.3.6: Includes. ****************** 1. LPDDR5: a. Updated CA-CS-PW measurements. b. Updated Reference level for VIX-WCK-Ratio measurement. v10.3.5: Includes. ****************** Key features for LPDDR5: 1. Supports 52 measurements of LPDDR5 System Transmitter Tests as per LPDDR5 JEDEC specifications: a. 09 Clock measurements b. 11 Write Clock measurements c. 11 Write Data measurements d. 07 Read Data measurements e. 07 CA Rx Specification measurements f. 07 CS Rx Specification measurements 2. Number of UIs support for Clock, Write Clock, Write Data and Read Data measurements. 3. Hexagonal shape mask and margin analysis. Key features for DDR5: 1. Performance improvement in overall test execution time when all tests are selected. 2. Single Acquire Type for CLOCK, DATA [Write], DATA [READ], CA measurements; group wise and Analyze. 3. Automatic calculation of amplitude for Read Write Burst detection. 4. Total 52 Measurements of DDR5 System Transmitter Tests as per DDR5 JEDEC Specification a. 21 Clock Measurements b. 9 Write Burst Measurements c. 1 Write Data Eye Measurement d. 13 Read Burst Measurements e. 8 Command and Address Measurements 5. Number of UIs support for Clock and Read/Write Data measurements. 6. Diamond shape mask and margin analysis for Write Data Eye measurement 7. DDR DFE: Deploys 'DDR DFE' Standalone application, that can be launched from TekScope > Analyze > DDR DFE 8. DDR DFE: Support DFE for Write Data Eye measurements 9. DDR DFE: Added Threshold "Auto" option selection. 10. DDR DFE: Increased the record length capability for continuous signal. Key features applicable for both DDR5 and LPDDR5: 1. De-embedding support applicable as per respective signal type in both Devices. 2. User Defined Acquisition support for all signal types respectively in both Devices. 3. Multi-Run feature is applicable for all tests in both Devices. 4. All tests are De-selected by default in Test Selection tab. 5. All acquisition sources are De-selected by default in Acquisition panel. 6. Enabled de-embedding and TriMode probe support in User Defined Acquisition (UDA). 7. Acquire parameters like Record Length and Sample Rate are moved to Global Configurations. 8. Save worst case waveform in known / TekExpress sessions. 9. Retain Vertical Scale support during acquisition. 10. Visual trigger setup file support in Visual Search. 11. User friendly measurement configurations. 12. Test Report to reflect all the statistics of the measurement. 13. User can select the source and channel in acquisition panel. 14. Voltage settings moved into common location for easy access. 15. Multiple Burst Detection Method supported - Read and Write, Write Only, Read Only, Visual Search. v10.2.1: Includes. ****************** 1. Total 52 Measurements of DDR5 System Transmitter Tests as per DDR5 JEDEC Specification a. 21 Clock Measurements b. 9 Write Burst Measurements c. 1 Write Data Eye Measurement d. 13 Read Burst Measurements e. 8 Command and Address Measurements 2. User defined acquisition mode for Clock, Command Address, Data Strobe, and Data for both Write and Read traffic (or bursts) 3. De-embedding support for Clock, Command Address, Data Strobe, and Data for both Write and Read traffic (or bursts) 4. Number of UIs support for Clock and Read/Write Data measurements 5. Deploys 'DDR DFE' Standalone application, that can be launched from TekScope > Analyze > DDR DFE 6. Support DFE for Write Data Eye measurements 7. User friendly measurement configurations 8. Test Report to reflect all the statistics of the measurement 9. User can select the source and channel in acquisition panel 10. Multiple Burst Detection Method supported - Read and Write, Write Only, Read Only, Visual Search 11. Diamond shape mask and margin analysis for Write Data Eye measurement ------------------------------------------------------------ 3. System Requirements To use TekExpress DDR Tx measurements following are the required software for MSO/DPO70000 Series: - LPDDR5SYS: LPDDR5 Memory Bus Electrical Validation and Analysis Oscilloscope Software. - DDR5SYS: DDR5 Memory Bus Electrical Validation and Analysis Oscilloscope Software. - SDLA64: Serial Data Link Analysis for Win 64-bit Scopes. - DJA – Jitter and Eye Diagram Analysis Tools - Advanced. - VET: VET – Visual Trigger. To use TekExpress DDR Tx measurements following are the required software for 7 Series DPO: - CMDDR5SYS: DDR5 System Transmitter Test (Tx) Automated Compliance Solution using TekExpress Framework - CMLPDDR5SYS: LPDDR5 and 5x System Transmitter Test (Tx) Automated Compliance Solution using TekExpress Framework - DJA: Advanced Jitter and Eye Analysis Software Supported Oscilloscopes: MSO71604DX, MSO72004DX, MSO72304DX, MSO72504DX, and MSO73304DX. DPO71604DX, DPO72004DX, DPO72304DX, DPO72504DX, and DPO73304DX. DPO71604SX, DPO72004SX, DPO72304SX, DPO72504SX, and DPO73304SX. Non-ATI channels of DPO75002SX, DPO75902SX, DPO7702SX, DPS75004SX, DPS75904SX, and DPS77004SX. with... TekScope version >= v10.15.x. DPOJET version >= 10.5.6.x [BETA] DPO714AX. with... TekScope version >= v2.20.x. ----------------------------------------------------------- 4. Known Limitations - Rj values might be higher if the signal has random tone jitter. - In few cases, the algorithm reports the lower Dj value. - Maximum Record Length up to 10M is recommended for running the measurements optimally. - Save worst case snapshot feature is limited for Write clock measurements of continuous and long burst if Record Length > 1M. Ensure Record length is less than or equal to 1M. - DFE, Burst detection method - Visual Search, Noise Compensation, Superimpose of Strobe on Eye and Margin values in Plots is not supported for Oscilloscope model DPO714AX. ----------------------------------------------------------- 5. Known Issues - Zoom plot works for continuous signals with 'Save worst case measurement snapshot' option selected in 'Measurements' 'Configuration. - This option is recommended for 'Acquire live waveforms' scenario. - Vertical cursors are not placed when both options 'Save worst case measurement snapshot' and 'Number of UI' are selected. - Read Burst Preamble Toggle in Burst detection panel is not updated automatically when Preamble Static is changed using SCPI command for LPDDR5. ----------------------------------------------------------- 6. Contacting Tektronix Tektronix, Inc. 14150 SW Karl Braun Drive P.O. Box 500 Beaverton, OR 97077 USA For product information, sales, service, and technical support: In North America, call 1-800-833-9200. Worldwide, visit www.tektronix.com to find contacts in your area.